NP3000 Wafer Prober

  • 8″&12″ probing
  • Muti-site probing
  • Independent F axis for probe cleaning function
  • PMI functions
  • High speed chuck temperature control
  • 13 points temperature sensing chuck
  • Auto wafer ID reader
  • GPIB/RS232/IO communications
  • Soft contact
  • Mold casting base & XYZ mechanism